A general scheme is developed to analyze the effect of non-uniform thermalmagnetization fluctuations in a thin film. The normal mode formalism isutilized to calculate random magnetization fluctuations. The magnetizationnoise is proportional to the temperature and inversely proportional to the filmvolume. The total noise power is the sum of normal mode spectral noises andmainly determined by spin-wave standing modes with an odd number ofoscillations. The effect rapidly decreases with increasing mode number. Anexact analytical calcutaion is presented for a two-cell model.
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